EEMCS EPrints Service
|
||||||||||||||||
2010
van Dijk, K. and Volf, P. and Detcheverry, C. and Yau, A. and Ngan, P. and Liang, Z. and Kuper, F.G.
(2010)
Validating foundry technologies for extended mission profiles.
In: Proceedings of IEEE International Reliability Physics Symposium 2010 (IRPS), 2-6 May 2010, Anaheim, CA, USA.
pp. 111-116.
IEEE Computer Society.
ISBN 978-1-4244-5430-3
|
||||||||||||||||