EEMCS

Koelmans, W.W. and Sebastian, A. and Abelmann, L. and Despont, M. and Pozidis, H. (2011) Force modulation for enhanced nanoscale electrical sensing. Nanotechnology, 22 (25). pp. 1-9. ISSN 0957-4484 *** ISI Impact 3,644 ***

Koelmans, W.W. and Sebastian, A. and Despont, M. and Pozidis, H. (2010) Force modulation for improved conductive-mode atomic force microscopy. In: Proceedings of the 10th IEEE Conference on Nanotechnology, IEEE-NANO 2010, 17-20 Aug 2010, Seoul, South-Korea. pp. 875-878. IEEE. ISBN 978-1-4244-7033-4

Engelen, J.B.C. and Rothuizen, H.E. and Drechsler, U. and Stutz, R. and Despont, M. and Abelmann, L. and Lantz, M.A. (2009) A Mass-balanced through-wafer electrostatic x/y-scanner for probe data storage. Microelectronic Engineering, 86 (4-6). pp. 1230-1233. ISSN 0167-9317 *** ISI Impact 1,569 ***

Engelen, J.B.C. and Rothuizen, H.E. and Drechsler, U. and Stutz, R. and Despont, M. and Lantz, M.A. (2008) Mass-balanced through-wafer electrostatic x/y-scanner for parallel probe data storage. In: 34th International Conference on Micro & Nano Engineering, 15-19 Sep 2008, Athens, Greece. 92. Ergo Publications. ISBN not assigned