EEMCS

Jedema, F.J. and in 't Zandt, M.A.A. and Wolters, R.A.M. and Tio Castro, D. and Hurkx, G.A.M. and Delhounge, R. and Gravesteijn, D.J. and Attenborough, K. (2008) Scaling properties of doped Sb₂Te phase change line cells In: 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design, Proceedings, NVSMW/ICMTD, Ogura, Taku. pp. 43-45. IEEE. ISBN 978-1-4244-1547-2

Roy, D. and in 't Zandt, M.A.A. and Delhounge, R. and Klootwijk, J.H. and Wolters, R.A.M. (2008) Influence of interfacial layer on contact resistance. In: Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008), 27-28 Nov 2008, Veldhoven, The Netherlands. pp. 499-500. Technology Foundation STW. ISBN 978-90-73461-56-7

Castro, D.T. and Goux, L. and Hurkx, G.A.M. and Attenborough, K. and Delhounge, R. and Lisoni, J. and Jedema, F.J. and in 't Zandt, M.A.A. and Wolters, R.A.M. and Gravesteijn, D.J. and Verheijen, M. and Kaiser, M. and Weemaes, R.G.R. (2007) Evidence of the thermo-electric Thomson effect and influence on the program conditions and cell optimization in phase-change memory cells. In: Proceedings of International Electron Devices Meeting (IEDM) 2007, 10-12 Dec. 2007, Washington, DC, USA. pp. 315-318. IEEE. ISBN 978-1-4244-1507-6