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2003
Bazen, A.M. and Veldhuis, R.N.J. and Croonen, G.H.
(2003)
Likelihood Ratio-Based Detection of Facial Features.
In: 14th Annual Workshop on Circuits Systems and Signal Processing (ProRISC), Veldhoven, The Netherlands.
pp. 323-329.
Technology Foundation STW.
ISBN 90-73461-39-1
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