EEMCS

Hurley, P.K. and Cherkaoui, K. and McDonnell, S. and Hughes, G. and Groenland, A.W. (2007) Characterisation and passivation of interface defects in (1 0 0)/Si/SiO₂/HfO₂/TiN gate stacks Microelectronics reliability, 47 (2007) (8). pp. 1195-1201. ISSN 0026-2714 *** ISI Impact 1,066 ***

Hurley, P.K. and Cherkaoui, K. and Groenland, A.W. (2006) Electrically active interface defects in the (100)Si/SiO_x/HfO₂/TiN system: Origin, instabilities and passivation (Invited) In: 210th Meeting of The Electrochemical Society (ECS), October 29-November 3, 2006, Cancun, Mexico. pp. 97-110. ECS Transactions 3. The Electrochemical Society. ISSN 1938-5862