EEMCS

Castro, D.T. and Goux, L. and Hurkx, G.A.M. and Attenborough, K. and Delhounge, R. and Lisoni, J. and Jedema, F.J. and in 't Zandt, M.A.A. and Wolters, R.A.M. and Gravesteijn, D.J. and Verheijen, M. and Kaiser, M. and Weemaes, R.G.R. (2007) Evidence of the thermo-electric Thomson effect and influence on the program conditions and cell optimization in phase-change memory cells. In: Proceedings of International Electron Devices Meeting (IEDM) 2007, 10-12 Dec. 2007, Washington, DC, USA. pp. 315-318. IEEE. ISBN 978-1-4244-1507-6