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2010
Krishnan, S. and Kerkhoff, H.G. and Doornbosch, K.D. and Brand , R.
(2010)
BlockLevel Bayesian Diagnosis of Analogue Electronic Circuits.
In: Design, Automation & Test in Europe Conference & Exhibition, DATE 2010, 8-12 Mar 2010, Dresden, Germany.
pp. 1767-1772.
IEEE.
ISSN 1530-1591
ISBN 978-1-4244-7054-9
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