EEMCS

Andricciola, P. (2011) Interpretation of MOS transistor mismatch signature through statistical device simulations. PhD thesis, University of Twente. ISBN 978-90-365-3289-1

Andricciola, P. and Tuinhout, H. and Wils, N. and Schmitz, J. (2011) Microsecond pulsed DC matching measurements on MOSFETs in strong and weak inversion. In: 24th International Conference on Microelectronic Test Structures, ICMTS 2011, 4-7 Apr 2011, Amsterdam. pp. 90-94. IEEE Electron Devices Society. ISSN 1071-9032 ISBN 978-1-4244-8527-7

Andricciola, P. and Tuinhout, H. and Wils, N. (2010) Trends and differences of the temperature effect on mismatch in different CMOS technology nodes. In: Proceedings of STW.ICT Conference 2010, 18-19 Nov 2010, Veldhoven, The Netherlands. Technology Foundation STW. ISBN 978-90-73461-67-3

Andricciola, P. and Tuinhout, H.P. (2010) Mismatch sources in LDMOS devices. In: Proceedings of the 40th European Solid-State Device Research, Essderc 2010, 13-17 Sep 2010, Sevilla, Spain. pp. 126-129. IEEE Solid-State Circuits Society. ISBN 978-1-4244-6660-3

Andricciola, P. and Tuinhout, H.P. (2009) Influence of halo doping profiles on MOS transistor mismatch. In: Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, 26-27 Nov 2009, Veldhoven, The Netherlands. pp. 55-58. Technology Foundation STW. ISBN 978-90-73461-62-8