EEMCS

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Abstract

Magnetic force microscopy (MFM) is a scanning probe technique that is used
to generate a high–resolution image of stray fields above a magnetic thin film,
with very little sample preparation. This makes the MFM the instrument of
choice for the analysis of bit patterns in hard disks. The tremendous increase
in data density of magnetic storage systems has pushed the bit size down into
the nanometer range, close to the maximum resolution of current MFM’s. This
resolution, which is currently limited by the geometry of the magnetic tip, has
to be improved, or the hard disk research community will loose a very powerful
imaging technique. In this thesis a new probe for magnetic microscopy and
recording, called the CantiClever, is presented. This probe is designed to address
the issue of the tip geometry of conventional MFM tips. The new probe also
allows for integration of other sensors besides an MFM tip with relative ease
due to its planar fabrication process.

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