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27743 Towards an automated and reusable in-field self-test solution for MPSoCs
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Ibrahim, A.M.Y. and Kerkhoff, H.G. (2016) Towards an automated and reusable in-field self-test solution for MPSoCs. In: 28th International Conference on Microelectronics (ICM 2016), 17-20 Dec 2016, Giza, Egypt. pp. 249-252. IEEE Computer Society. ISBN 978-1-5090-5721-4

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Official URL: http://dx.doi.org/10.1109/ICM.2016.7847862

Abstract

Logic Built-In-Self-Test has been used for long time in order to reduce the cost of manufacturing tests. Recently, LBIST has been increasingly used for lifetime dependability tests, especially in safety-critical applications such as in automotive. In this paper, the use of the IEEE 1687 standard for enabling an automated in-field LBIST solution with reusable test procedures is introduced. An IEEE 1687-compliant dependability manager which is capable of performing LBIST on IEEE 1500 wrapped cores is proposed. By using the IEEE 1687 networks for test delivery, LBIST-access and configuration, this solution becomes reusable and consequently reduces the design time.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:ELESIS: European Library Based Flow Of Embedded Silicon Test Instruments
ID Code:27743
Status:Published
Deposited On:13 February 2017
Refereed:Yes
International:Yes
More Information:statistics

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