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27610 Detecting intermittent resistive faults in digital CMOS circuits
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Ebrahimi, H. and Kerkhoff, H.G. (2016) Detecting intermittent resistive faults in digital CMOS circuits. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 19-20 Sep 2016, Storrs, CT, USA. pp. 87-90. IEEE Computer Society. ISBN 978-1-5090-3623-3

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Official URL: http://dx.doi.org/10.1109/DFT.2016.7684075

Abstract

Interconnection reliability threats dependability of highly critical electronic systems. One of most challenging interconnection-induced reliability threats are intermittent resistive faults (IRFs). The occurrence rate of this kind of defects can take e.g. one month, and the duration of defects can be as short as a few nanoseconds. As a result, evoking and detecting these faults is a big challenge. IRFs can cause timing deviations in data paths in digital systems during its operating time. This paper proposes an online digital slack monitor which is able to detect small timing deviations caused by IRFs in digital systems. The simulation results show that the proposed monitor is effective in detecting IRFs.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:BASTION: On Board and SoC Test Instrumentation for Ageing and No-Failures Found phenomena
Uncontrolled Keywords:intermittent fault, no fault found
ID Code:27610
Status:Published
Deposited On:25 January 2017
Refereed:Yes
International:Yes
More Information:statistics

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