Home > Publications
Home University of Twente
Prospective Students
Intranet (internal)

EEMCS EPrints Service

27609 Testing for intermittent resistive faults in CMOS integrated systems
Home Policy Brochure Browse Search User Area Contact Help

Ebrahimi, H. and Kerkhoff, H.G. (2016) Testing for intermittent resistive faults in CMOS integrated systems. In: IEEE 2016 Euromicro Conference on Digital System Design (DSD) , 31 Aug - 02 Sep 2016, Limassol, Cyprus. pp. 703-707. IEEE Circuits & Systems Society. ISBN 978-1-5090-2817-7

Full text available as:

- Univ. of Twente only
1362 Kb

Official URL:


The required dependability of integrated CMOS systems has to be continuously increased because nowadays many applications are safety-critical. Having a good knowledge of potential realistic faults plays an important role in this case. The most difficult and expensive category of faults that can occur are the no-faults found (NFF). We have investigated the influence of intermittent resistive faults (IRF), an NFF resulting from e.g. cracks in ball-grid array-to-board interconnections and on-chip interconnections. Previous circuit simulations from us have indicated the potential effect of IRFs on the behavior of analogue as well as simple digital CMOS circuits. In this paper, a hardware IRF generator is presented to accelerate the IRF fault injection process. As a case study, a digital CMOS UART is selected and experimental results for software and hardware-based fault injections are provided. The experimental results demonstrate that the IRF fault injection can be accelerated by 7 orders of magnitude.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:BASTION: On Board and SoC Test Instrumentation for Ageing and No-Failures Found phenomena
Uncontrolled Keywords:intermittent fault, No Fault Found
ID Code:27609
Deposited On:25 January 2017
More Information:statistics

Export this item as:

To request a copy of the PDF please email us request copy

To correct this item please ask your editor

Repository Staff Only: edit this item