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27609 Testing for intermittent resistive faults in CMOS integrated systems
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Ebrahimi, H. and Kerkhoff, H.G. (2016) Testing for intermittent resistive faults in CMOS integrated systems. In: IEEE 2016 Euromicro Conference on Digital System Design (DSD) , 31 Aug - 02 Sep 2016, Limassol, Cyprus. pp. 703-707. IEEE Circuits & Systems Society. ISBN 978-1-5090-2817-7

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Official URL: http://dx.doi.org/10.1109/DSD.2016.58

Abstract

The required dependability of integrated CMOS systems has to be continuously increased because nowadays many applications are safety-critical. Having a good knowledge of potential realistic faults plays an important role in this case. The most difficult and expensive category of faults that can occur are the no-faults found (NFF). We have investigated the influence of intermittent resistive faults (IRF), an NFF resulting from e.g. cracks in ball-grid array-to-board interconnections and on-chip interconnections. Previous circuit simulations from us have indicated the potential effect of IRFs on the behavior of analogue as well as simple digital CMOS circuits. In this paper, a hardware IRF generator is presented to accelerate the IRF fault injection process. As a case study, a digital CMOS UART is selected and experimental results for software and hardware-based fault injections are provided. The experimental results demonstrate that the IRF fault injection can be accelerated by 7 orders of magnitude.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:BASTION: On Board and SoC Test Instrumentation for Ageing and No-Failures Found phenomena
Uncontrolled Keywords:intermittent fault, No Fault Found
ID Code:27609
Status:Published
Deposited On:25 January 2017
Refereed:Yes
International:Yes
More Information:statistics

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