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27201 Investigation of Intermittent Resistive Faults in Digital CMOS Circuits
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Kerkhoff, H.G. and Ebrahimi, H. (2015) Investigation of Intermittent Resistive Faults in Digital CMOS Circuits. Journal of Circuits, Systems and Computers, 25 (03). pp. 1-17. ISSN 0218-1266 *** ISI Impact 0,308 ***

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Official URL: http://dx.doi.org/10.1142/S0218126616400235

Abstract

No fault found (NFF) is a major threat in extremely dependable high-end process node integrated systems, in e.g., avionics. One category of NFFs is the intermittent resistive fault (IRF), often originating from bad (e.g., via- or TSV-based) interconnections. This paper will show the impact of these faults on the behavior of a digital CMOS circuit via simulation. As the occurrence rate of this kind of defects can take e.g., one month, while the duration of the defect can be as short as 50ns, thus to evoke and detect these faults is a huge scientific challenge. Two methods to detect short pulses induced by IRFs are proposed. To improve the task of maintenance of avionics and reduce the current high debugging costs, an on-chip data logging system with time stamp and stored environmental conditions is introduced. Finally, a hardware implementation of an IRF generator is presented.


Read More: http://www.worldscientific.com/doi/10.1142/S0218126616400235

Item Type:Article
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:BASTION: On Board and SoC Test Instrumentation for Ageing and No-Failures Found phenomena
Uncontrolled Keywords:Dependability; reliability; no faults found; intermittent resistive faults; evoking &
detection of intermittent faults.
ID Code:27201
Status:Published
Deposited On:25 January 2017
Refereed:Yes
International:Yes
ISI Impact Factor:0,308
More Information:statistics

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