EEMCS

Home > Publications
Home University of Twente
Education
Research
Prospective Students
Jobs
Publications
Intranet (internal)
 
 Nederlands
 Contact
 Search
 Organisation

EEMCS EPrints Service


26908 Simulating NBTI degradation in arbitrary stressed analog/mixed-signal environments
Home Policy Brochure Browse Search User Area Contact Help

Wan, Jinbo and Kerkhoff, H.G. (2016) Simulating NBTI degradation in arbitrary stressed analog/mixed-signal environments. IEEE Transactions on Nanotechnology, 15 (2). pp. 137-148. ISSN 1536-125X *** ISI Impact 1,702 ***

Full text available as:

PDF
- Univ. of Twente only
2157 Kb

Official URL: http://dx.doi.org/10.1109/TNANO.2015.2505092

Exported to Metis

Abstract

A compact negative bias temperature instability (NBTI) model is presented by iteratively solving the RD equations in a simple way. The new compact model can handle arbitrary stress conditions without solving time-consuming equations, and is hence, suitable for analogue/mixed-signal NBTI simulations in SPICE-like environments. The model has been implemented in Cadence ADE with Verilog-A and also takes the stochastic effect of ageing into account. The simulation speed has increased at least a thousand times compared to classical RD models. The performance of the model has been validated by both RD theoretical solutions and 140-nm CMOS silicon measurement.

Item Type:Article
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:IMMORTAL: Integrated Modelling, Fault Management, Verification and Reliable Design Environment for Cyber-Physical Systems
Uncontrolled Keywords:analog, CMOS, NBTI, reliability, reaction-diffusion
ID Code:26908
Status:Published
Deposited On:21 March 2016
Refereed:Yes
International:Yes
ISI Impact Factor:1,702
More Information:statisticsmetis

Export this item as:

To request a copy of the PDF please email us request copy

To correct this item please ask your editor

Repository Staff Only: edit this item