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26456 Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor
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Zhao, Yong and Kerkhoff, H.G. (2015) Predicting aging caused delay degradation with alternative IDDT testing in a VLIW processor. In: Proceedings of the final Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, MEDIAN 2015, 10-11 Nov 2015, Tallinn, Estonia. pp. 27-32. European Cooperation in Science and Technology. ISBN not assigned

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Official URL: http://www.median-project.eu/wp-content/uploads/MEDIAN-Finale-s1-2.pdf

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Abstract

In this paper, delay and transient power-supply current (IDDT) testing has been applied for a 90nm VLIW DSP IP core, to demonstrate the IDDT testing an effective alternative of delay testing to detect aging degradation. The test environment for validation, implementing an accelerated test (AT) has been investigated, delay and IDDT measurement data resulting from AT is presented and analysed. It is found that both delay and IDDT testing results for the processor characterize the power law degradation with the aging trend, which is in coherence with behaviour of the NBTI aging mechanism. Analysis shows their coefficient is of strong correlation.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:STARS: Sensor Technology Applied in Reconfigurable systems for Sustainable Security
Additional Information:AK: 1) In principle, Official URL should not be a link to a PDF file itself. It should be a link to some page where your contribution is visible and can be downloaded from. Are there such options? 2) Do you have a confirmation that this work is refereed? Normally such workshop contributions, related to EU projects, are not refereed. ZY: 1)Right now I can only find the URL like mentioned, and it can be seen and downloaded. 2)Here I forward my paper reviewing below. It is contribution to a workshop but with a 20 - 30 percent acceptation rate.
Uncontrolled Keywords:delay testing, IDDT testing, NBTI, functional testing, reliability testing, DSP processor, aging, alternative testing
ID Code:26456
Status:Published
Deposited On:30 November 2015
Refereed:Yes
International:Yes
More Information:statisticsmetis

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