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26388 Unit-based functional IDDT testing for aging degradation monitoring in a VLIW processor
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Zhao, Yong and Kerkhoff, H.G. (2015) Unit-based functional IDDT testing for aging degradation monitoring in a VLIW processor. In: 18th Euromicro Conference on Digital Systems Design, DSD 2015, 26-28 Aug 2015, Funchal, Portugal. pp. 353-358. IEEE Computer Society. ISBN 978-1-4673-8035-5

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Official URL: http://dx.doi.org/10.1109/DSD.2015.113

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Abstract

In this paper, functional unit-based IDDT testing has been applied for a 90nm VLIW processor to monitor its aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test-program development based on the architecture of a single DSP processor, as well as implementation of an accelerated test (AT) is investigated and IDDT measurement results are evaluated. It is found that decrements of peak IDDT values of crucial functional units inside the processor characterize the power-law degradation with the aging time. This is in coherence with the aging behaviour of (PMOS) transistors caused by Negative-Bias-Temperature-Instability (NBTI), thereby validating the feasibility of this technique in monitoring target-process aging degradation.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:STARS: Sensor Technology Applied in Reconfigurable systems for Sustainable Security
Uncontrolled Keywords:IDDT testing, NBTI, functional testing, reliability testing, DSP processor, aging, accelerated test
ID Code:26388
Status:Published
Deposited On:27 November 2015
Refereed:Yes
International:Yes
More Information:statisticsmetis

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