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26387 A genetic algorithm based remaining lifetime prediction for a VLIW processor employing path delay and IDDX testing
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Zhao, Yong and Kerkhoff, H.G. (2016) A genetic algorithm based remaining lifetime prediction for a VLIW processor employing path delay and IDDX testing. In: International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2016 , 12-14 Apr 2016, Istanbul, Turkey. pp. 10-14. IEEE Computer Society. ISBN 978-1-5090-0336-5

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Official URL: http://dx.doi.org/10.1109/DTIS.2016.7483805

Abstract

In this paper, critical path-delay time, and quiescent and transient power-supply current testing have been applied to a 90nm VLIW processor, to predict the remaining lifetime of this processor. The test environment for validation, via implementing an accelerated test has been realized. The resulting delay and current measurement data is presented next, followed by applying a genetic algorithm (GA) to construct a lifetime prediction model for the processor. The calculated remaining lifetime predicted by power-supply testing is close to that of delay-time testing.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:STARS: Sensor Technology Applied in Reconfigurable systems for Sustainable Security
Uncontrolled Keywords:Delays, Genetic algorithms, Testing, Degradation, Current measurement, Aging, Temperature measurement
ID Code:26387
Status:Published
Deposited On:04 November 2016
Refereed:Yes
International:Yes
More Information:statistics

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