EEMCS

Home > Publications
Home University of Twente
Education
Research
Prospective Students
Jobs
Publications
Intranet (internal)
 
 Nederlands
 Contact
 Search
 Organisation

EEMCS EPrints Service


26293 Reliability of SAR ADCs and associated embedded instrument detection
Home Policy Brochure Browse Search User Area Contact Help

Wan, Jinbo and Kerkhoff, H.G. (2015) Reliability of SAR ADCs and associated embedded instrument detection. In: 20th International Mixed-Signal Testing Workshop, IMSTW 2015, 24-26 June 2015, Paris, France. pp. 1-5. IEEE Computer Society. ISBN 978-1-4673-6732-5

Full text available as:

PDF
- Univ. of Twente only
574 Kb

Official URL: http://dx.doi.org/10.1109/IMS3TW.2015.7177870

Exported to Metis

Abstract

Successive-approximation-register (SAR) analog-to-digital converters (ADCs) represent the majority of the ADC market from medium to high resolution ADCs. Due to its low power, high-performance and small area in Mega-Hz range, SAR ADCs are increasingly attractive for todays safe-critical applications like automotive. Recently, much research has been carried out on self-calibrations of SAR ADCs, which are mostly focussed on passive capacitor banks inside SAR ADCs. However the reliability of SAR ADCs is rarely reported, which is more related to the active circuit parts and is also essential for safe-critical applications. In this paper, the focus will be on the reliability effects and associated embedded instrument detection of a 10-bits SAR ADC in 65nm CMOS technology. The NBTI degradation in the bootstrapped switches, self-timing asynchronous SAR logics, input buffer and comparator inside a 10-bits SAR ADC are investigated as well as the overall performance degradation of the ADC. Finally, embedded instrument methods are proposed to detect these reliability influences in SAR ADCs.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:ELESIS: European Library Based Flow Of Embedded Silicon Test Instruments
ID Code:26293
Status:Published
Deposited On:02 November 2015
Refereed:Yes
International:Yes
More Information:statisticsmetis

Export this item as:

To request a copy of the PDF please email us request copy

To correct this item please ask your editor

Repository Staff Only: edit this item