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26232 Determination of the aging offset voltage of AMR sensors based on accelerated degradation test
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Zambrano Constantini, A.C. and Kerkhoff, H.G. (2015) Determination of the aging offset voltage of AMR sensors based on accelerated degradation test. In: 20th International Mixed-Signal Testing Workshop, IMSTW 2015, 24-26 Jun 2015, Paris, France. pp. 1-5. IEEE . ISBN 978-1-4673-6732-5

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Official URL: http://dx.doi.org/10.1109/IMS3TW.2015.7177871

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Abstract

Usually Anisotropic Magnetoresistance angle sensors are configured with two Wheatstone bridges, but an undesirable offset voltage included in the sensor output affects its accuracy. The total offset voltage combines a voltage due to resistance mismatches during manufacturing and a voltage from inequalities in the magnetic sensitivity. This paper focuses on identifying a consistent trend between the bridges' offset voltages. Compared with previous studies that focus on lifetime tests using high temperatures, this research uses temperature cycling to study offset voltage and sensitivity variations due to aging effects. A consistent trend between the bridges' offset voltages could not be found. The two offset components can add to or subtract from each other and their interaction can change over time due to variations in the sensor's material properties. To achieve a precise angle measurement, the offset voltage must be compensated continuously over the entire sensor lifetime.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:ELESIS: European Library Based Flow Of Embedded Silicon Test Instruments
Uncontrolled Keywords:AMR angle sensor; offset voltage; degradation test
ID Code:26232
Status:Published
Deposited On:31 August 2015
Refereed:Yes
International:Yes
More Information:statisticsmetis

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