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26208 Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard
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Kerkhoff, H.G. and Ebrahimi, H. (2015) Detection of intermittent resistive faults in electronic systems based on the mixed-signal boundary-scan standard. In: 6th Asia Symposium on Quality Electronic Design, ASQED 2015, 6-7 Aug 2015, Kuala Lumpur, Malaysia. pp. 77-82. IEEE Circuits & Systems Society. ISBN 978-1-4673-7495-8

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Official URL: http://dx.doi.org/10.1109/ACQED.2015.7274011

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Abstract

In avionics, like glide computers, the problem of No Faults Found (NFF) is a very serious and extremely costly affair. The rare occurrences and short bursts of these faults are the most difficult ones to detect and diagnose in the testing arena. Several techniques are now being developed in ICs by us to cope with one particular category of NFFs, being intermittent resistive faults (IRF). The reuse of these (on-chip) embedded instruments for detection of these faults at the board-level is being investigated in conjunction with the possibilities of enhancing the (mixed-signal) boundary-scan standard IEEE 1149.4. This paper will explore how this can be accomplished.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:BASTION: On Board and SoC Test Instrumentation for Ageing and No-Failures Found phenomena
Uncontrolled Keywords:Reliability, Dependability, Mixed-Signal test, Boundary-Scan, IEEE 1149.4, No Faults Found, Intermittent Resistive Faults, Evoking & Detection of faults
ID Code:26208
Status:Published
Deposited On:23 February 2016
Refereed:No
International:Yes
More Information:statisticsmetis

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