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26191 Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation
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Zhao, Yong and Kerkhoff, H.G. (2015) Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation. In: 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS 2015), 21-23 April 2015, Naples, Italy. pp. 1-5. IEEE Computer Society. ISBN 978-1-4799-1999-4

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Official URL: http://dx.doi.org/10.1109/DTIS.2015.7127359

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Abstract

In this paper, functional IDDQ testing has been applied for a 90nm VLIW processor to effectively detect aging degradation. This technique can provide health data for reliability evaluation as used in e.g. prognostic software for lifetime prediction. The test environment for validation, implementing an accelerated test (AT), has been investigated and IDDQ measurement data resulting from AT is presented. It is found that the quiescent current for the processor characterizes power degradation with a coefficient of -0.025 with the aging trend. This is in coherence with behaviour of the NBTI aging mechanism, but contradicting other mechanisms such as TDDB. It shows the NBTI aging is the dominant factor for processor technology of 90nm and beyond.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:STARS: Sensor Technology Applied in Reconfigurable systems for Sustainable Security
Uncontrolled Keywords:DSP processor, IDDQ testing, NBTI, aging, functional testing, nanoelectronics, reliability testing
ID Code:26191
Status:Published
Deposited On:18 August 2015
Refereed:Yes
International:Yes
More Information:statisticsmetis

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