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25382 iJTAG integration of complex digital embedded instruments
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Ibrahim, A.M.Y. and Kerkhoff, H.G. (2014) iJTAG integration of complex digital embedded instruments. (Invited) In: 9th International Design & Test Symposium, IDT 2014, 16-18 Dec 2014, Algiers, Algeria. pp. 18-23. IEEE Computer Society. ISBN 978-1-4799-8200-4

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Official URL: http://dx.doi.org/10.1109/IDT.2014.7038580

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Abstract

Embedded instruments are becoming used more often in modern SoCs for different testing and measurement purposes. IEEE 1687 (iJTAG) is a newly IEEE approved draft standard for embedded instruments access and control based on the widespread IEEE 1149.1 TAP port. In this paper the work done for enabling iJTAG control, observation and reconfiguration of complex digital embedded instruments will be discussed. Two digital embedded instruments used as a part of an MPSoC dependability management solution are presented as a case study, and the work done to enable iJTAG access is illustrated. Verification of the iJTAG control, observation and reconfiguration is also presented.

Item Type:Conference or Workshop Paper (Full Paper, Invited/Keynote Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-DSN: Dependable Systems and Networks, CTIT-WiSe: Wireless and Sensor Systems
Research Project:ELESIS: European Library Based Flow Of Embedded Silicon Test Instruments
ID Code:25382
Status:Published
Deposited On:17 February 2015
Refereed:Yes
International:Yes
More Information:statisticsmetis

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