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25306 The influence of no fault found in analogue CMOS circuits
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Wan, Jinbo and Kerkhoff, H.G. (2014) The influence of no fault found in analogue CMOS circuits. In: 2014 International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW'14), 17-19 Sep 2014, Porto Alegre, Brazil. pp. 1-6. IEEE Computer Society. ISBN 978-1-47996-540-3

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Official URL: http://dx.doi.org/10.1109/IMS3TW.2014.6997388

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Abstract

The most difficult fault category in electronic systems is the “No Fault Found” (NFF). It is considered to be the most costly fault category in, for instance, avionics. The relatively few papers in this area rarely deal with analogue integrated systems. In this paper a simple simulation model has been developed for a particular type of NFF, the intermittent resistive fault resulting from bad interconnections. Simulations have been carried out with respect to a CMOS operational amplifier under influence of NFFs, and the resulting behaviour under different fault conditions has been examined.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-DSN: Dependable Systems and Networks, CTIT-WiSe: Wireless and Sensor Systems
Research Project:TOETS: Towards One European Test Solution
Uncontrolled Keywords:No Fault Found; NFF; intermittent resistive faults;
TSV; cold soldering; analogue CMOS circuits
ID Code:25306
Status:Published
Deposited On:15 December 2014
Refereed:Yes
International:Yes
More Information:statisticsmetis

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