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23841 The essence of reliability estimation during operational life for achieving high system dependability
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Khan, M.A. and Kerkhoff, H.G. (2013) The essence of reliability estimation during operational life for achieving high system dependability. In: 16th IEEE International Euromicro Conference on Digital System Design, DSD 2013, 4-6 Sep 2013, Santander, Spain. pp. 575-581. IEEE . ISBN 978-0-7695-5074-9

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Official URL: http://dx.doi.org/10.1109/DSD.2013.68

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Abstract

System dependability has become important for critical applications in recent years as technology is moving towards smaller dimensions. Achieving high dependability can be supported by reliability estimations during the operational life. In addition this requires a workflow for regularly monitoring reliability and taking necessary repair actions. This has been proposed as a possible solution where degradation in system-level performance parameters, being directly influenced by variations and degradation in device-level parameters, has been considered a potential possibility for estimating reliability during the operational life of a system. Furthermore, the degradation rate of these system-level performance parameters depends on the initial values dispersion as a result of fabrication-related process variations. This requires a database of initial and runtime system-level performance parameters at every start and at every potentially anticipated critical time-point of the system. Therefore, initial system specifications at the design-time and runtime performance parameter measurements stored in the database are used to estimate reliability and taking necessary actions for enhancing system dependability via repair. Simulation results for an example target system in a LabVIEW environment fully support the proposed idea.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-DSN: Dependable Systems and Networks, CTIT-WiSe: Wireless and Sensor Systems
Uncontrolled Keywords:reliability; lifetime prediction; dependable system
ID Code:23841
Status:Published
Deposited On:21 October 2013
Refereed:Yes
International:Yes
More Information:statisticsmetis

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