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22730 Embedded instruments for enhancing dependability of analogue and mixed-signal IPs
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Wan, Jinbo and Kerkhoff, H.G. (2015) Embedded instruments for enhancing dependability of analogue and mixed-signal IPs. In: NIEEE 13th International New Circuits and Systems Conference, NEWCAS 2015, 7-10 June 2015, Grenoble, France. pp. 1-4. IEEE Circuits & Systems Society. ISBN 978-1-4799-8893-8

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Official URL: http://dx.doi.org/10.1109/NEWCAS.2015.7181979

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Abstract

The idea of an embedded instrument (EI) is to embed some form of test and measurement into silicon to characterize, debug and test chips. The concept of the EI is different from build-in self test (BIST) and other kinds of monitors by the fact that embedded instruments can provide the user with rich and detailed information with respect to the performances of the target, not just a true/false indication. In this paper, two embedded instruments for analogue and mixed-signal IPs focusing on dependability applications are introduced. They are the EI for measuring MOS transistors' threshold voltage and the EI for testing OpAmps' gain and offset. Measurements as well as simulation results are provided to validate these EIs and show their efficiency in monitoring the ageing of analogue and mixed-signal IPs in their life time, and enable the path to enhance dependability.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-General
Research Project:ELESIS: European Library Based Flow Of Embedded Silicon Test Instruments
ID Code:22730
Status:Published
Deposited On:02 November 2015
Refereed:Yes
International:Yes
More Information:statisticsmetis

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