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22670 Selection of tests for outlier detection
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Bossers, H.C.M. and Hurink, J.L. and Smit, G.J.M. (2013) Selection of tests for outlier detection. In: 31st IEEE VLSI Test Symposium, VTS 2013, 29 Apr - 2 May 2013, Berkeley, CA, USA. pp. 1-6. IEEE Computer Society. ISSN 1093-0167 ISBN 978-1-4673-5542-1

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Integrated circuits are tested thoroughly in order to meet the high demands on quality. As an additional step, outlier detection is used to detect potential unreliable chips such that quality can be improved further. However, it is often unclear to which tests outlier detection should be applied and how the parameters must be set, such that outliers are detected and yield loss remains limited. In this paper we introduce a mathematical framework, that given a set of target devices, can select tests for outlier detection and set the parameters for each outlier detection method. We provide results on real world data and analyze the resulting yield loss and missed targets.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-DMMP: Discrete Mathematics and Mathematical Programming, EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-IE&ICT: Industrial Engineering and ICT, CTIT-WiSe: Wireless and Sensor Systems
Research Project:DTFC: Dynamic Test Floor Controller
Uncontrolled Keywords:Integrated circuits, Outlier detection, Test selection, Reliability, Adaptive test
ID Code:22670
Deposited On:19 August 2013
More Information:statisticsmetis

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