EEMCS

Home > Publications
Home University of Twente
Education
Research
Prospective Students
Jobs
Publications
Intranet (internal)
 
 Nederlands
 Contact
 Search
 Organisation

EEMCS EPrints Service


21155 New View Requirements for Analogue/MS IPs for Dependability Optimization in Heterogeneous SoC Design
Home Policy Brochure Browse Search User Area Contact Help

Kerkhoff, H.G. (2011) New View Requirements for Analogue/MS IPs for Dependability Optimization in Heterogeneous SoC Design. In: 17th IEEE International Mixed-Signals, Sensors ans Systems Test Workshop, IMS3TW 2011, 16-18 May 2011, Santa Barbara, USA. pp. 5-11. IEEE Computer Society. ISBN 978-0-7695-4479-3

Full text available as:

PDF
- Univ. of Twente only
277 Kb

Official URL: http://dx.doi.org/10.1109/IMS3TW.2011.22

Exported to Metis

Abstract

Nowadays, safety-critical systems in for instance the automotive industry routinely consist of complex Systems-on-Chip in increasingly advanced processes. The decreased reliability for advanced processes, along with the harsh environmental conditions in cars, causes serious concerns for the dependability of those SoCs. For this reason, some digital IP vendors for those systems are already starting to incorporate additional information on IPs to system designers, for instance to include safety parameters. This provides system designers with a possibility to optimize/guarantee their design along an additional design axis (e.g. safety). As most automotive SoCs incorporate analogue front/back-ends, a similar requirement would also have to be included for analogue/mixed-signal IPs. Because of limited robustness, and a variety of parameters, this has not been considered for analogue/mixed-signal IPs yet. This paper presents a first step towards the introduction of a dependability view for analogue/mixed-signal IPs, and an investigation which benefits like increased dependability could be expected at system level.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-CAES: Computer Architecture for Embedded Systems
Research Program:CTIT-DSN: Dependable Systems and Networks, CTIT-WiSe: Wireless and Sensor Systems
Research Project:TOETS: Towards One European Test Solution
Uncontrolled Keywords:dependability, reliability, fault-tolerance, availability, safety, MS-IP specification
ID Code:21155
Status:Published
Deposited On:09 January 2012
Refereed:Yes
International:Yes
More Information:statisticsmetis

Export this item as:

To request a copy of the PDF please email us request copy

To correct this item please ask your editor

Repository Staff Only: edit this item