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Krishnan, S. and Kerkhoff, H.G.
(2011)
A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses.
In: Proceedings 16th IEEE European Test Symposium, ETS 2011, 23 May - 27 May 2011, Trondheim, Norway.
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IEEE Computer Society.
ISSN 1530-1877
ISBN 978-1-4577-0483-3
Full text available as:  | PDF - Univ. of Twente only
197 Kb |
Official URL: http://dx.doi.org/10.1109/ETS.2011.31  AbstractMahalanobis distance is one of the commonly used multivariate metrics for finely segregating defective devices from non-defective ones. An associated problem with
this approach is the estimation of a robust mean and a covariance matrix. In the absence of such robust estimates, especially in the presence of outliers to test-response measurements, and only a sub-sample from the population is available, the distance metric becomes unreliable. To circumvent this problem, multiple Mahalanobis
distances are calculated from selected sets of test-response measurements. They are then suitably formulated to derive a metric that has a reduced variance and robust to shifts or deviations in measurements. In this paper, such a formulation is proposed to qualitatively screen product outliers and quantitatively measure the reliability of the non-defective ones. The application of method is exemplified over a test set of an industrial automobile
product. | Item Type: | Conference or Workshop Paper (Full Paper, Talk) |
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| Research Group: | EWI-CAES: Computer Architecture for Embedded Systems |
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| Research Program: | CTIT-DSN: Dependable Systems and Networks, CTIT-WiSe: Wireless and Sensor Systems |
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| Research Project: | TOETS: Towards One European Test Solution |
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| Additional Information: | Best paper award ETS 2011
ISSN: 1530-1877 |
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| Uncontrolled Keywords: | outliers, metrics, manufacturing test |
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| ID Code: | 21152 |
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| Status: | Published |
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| Deposited On: | 09 January 2012 |
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| Refereed: | Yes |
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| International: | Yes |
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| More Information: | statisticsmetis |
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