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16204 Improved binomial charts for monitoring high-quality processes

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Albers, W. (2009) Improved binomial charts for monitoring high-quality processes. Memorandum 1905, Department of Applied Mathematics, University of Twente, Enschede. ISSN 1874-4850

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Abstract

For processes concerning attribute data with (very) small failure rate p, often negative binomial control charts are used. The decision whether to stop or continue is made each time r failures have occurred, for some r≥1. Finding the optimal r for detecting a given increase of p first requires alignment of the charts in terms of in-control behavior. In the present paper binomial charts are subjected to this same requirement. Subsequent study reveals that the resulting charts are quite attractive in several aspects, such as detection power. For the case of unknown p, an estimated version of the chart is derived and studied.

Item Type:	Internal Report (Memorandum)
Research Group:	EWI-SP: Statistics and Probability
Research Program:	CTIT-IE&ICT: Industrial Engineering and ICT
Uncontrolled Keywords:	Statistical Process Control, Health care monitoring, Geometric charts, Average run length, Estimated parameters
ID Code:	16204
Deposited On:	22 October 2009
More Information:	statistics metis

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Improved binomial charts for monitoring high-quality processes (deposited 22 October 2009)
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- Improved binomial charts for high-quality processes (deposited 18 July 2011)

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