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Shang, X. and Veldhuis, R.N.J.
(2007)
Local absolute binary patterns as image preprocessing for grip-pattern recognition in smart gun.
In: IEEE conference on Biometrics: Theory, Applications and Systems, 27-29 Sep 2007, Washington DC.
.
University of Notre Dame.
ISBN 978-1-4244-1597-7
Full text available as: Official URL: http://dx.doi.org/10.1109/BTAS.2007.4401939  AbstractIn a biometric verification system of a smart
gun, the rightful user is recognized based on his handpressure pattern. The main factor which affects the
verification performance of this system is the variation
between the probe image and the gallery image of a
subject, in particular when the probe and the gallery
images have been recorded with a few weeks in between.
One of the major variations is in the pressure distribution
of images. In this work, we propose a novel preprocessing
technique, Local Absolute Binary Patterns, prior to grippattern classification. With respect to a certain pixel in an image, Local Absolute Binary Patterns processing
quantifies how its neighboring pixels are fluctuating.
It will be shown that this technique can both reduce
the variation of pressure distribution, and extract information of the hand shape in the image. Therefore, a significant improvement of the verification result has been achieved. | Item Type: | Conference or Workshop Paper (Full Paper, Talk) |
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| Research Group: | EWI-SAS: Signals and Systems |
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| Research Program: | CTIT-ISTRICE: Integrated Security and Privacy in a Networked World, UT-CST: Crime Science Twente |
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| Research Project: | Secure Grip |
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| ID Code: | 11334 |
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| Status: | Published |
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| Deposited On: | 28 November 2007 |
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| Refereed: | Yes |
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| International: | Yes |
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| More Information: | statisticsmetis |
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