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11292 TTCN-3 for Distributed Testing Embedded Software
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Blom, S.C.C. and Deiß, T. and Ioustinova, N. and Kontio, A. and van de Pol, J.C. and Rennoch, A. and Sidorova, N. (2007) TTCN-3 for Distributed Testing Embedded Software. In: Perspectives of Systems Informatics, 27-30 Jun 2006, Novosibirsk, Russia. pp. 98-111. Lecture Notes in Computer Science 4378. Springer Verlag. ISSN 0302-9743 ISBN 978-3-540-70880-3

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Official URL: http://dx.doi.org/10.1007/978-3-540-70881-0_11

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Abstract

TTCN-3 is a standardized language for specifying and executing test suites that is particularly popular for testing embedded systems. Prior to testing embedded software in a target environment, the software is usually tested in the host environment. Executing in the host environment often affects the real-time behavior of the software and, consequently, the results of real-time testing.
Here we provide a semantics for host-based testing with simulated time and a a simulated-time solution for distributed testing with TTCN-3.

Item Type:Conference or Workshop Paper (Full Paper, Talk)
Research Group:EWI-FMT: Formal Methods and Tools
Research Program:CTIT-DSN: Dependable Systems and Networks
ID Code:11292
Status:Published
Deposited On:26 October 2007
Refereed:Yes
International:Yes
More Information:statisticsmetis

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